Metal 430 - Fall 2000

Tentative Course Schedule

August 22	General Nature of materials characterization - morphology, chemistry, etc. Techniques for bulk characterization Techniques for surface characterization
August 24	X-ray diffraction Nature and production of x-rays Bragg's law and diffraction patterns Instrument Specimen preparation Qualitative analysis - the PDF Industrial examples Four-circle diffractometry
September 14	X-ray fluorescence Purpose General characteristics Wavelength dispersive instrument Energy dispersive instrument Industrial example
September 21	Optical microscopy Optics Lenses and image formation Depth of field Numerical aperture Resolution Instrument Specimen preparation Contrast Examples
October 3	Electron microscopy Electron sources, acceleration, and focusing Scanning electron microscopy Transmission electron microscopy
October 19	Chemical analysis in electron microscopes Electron-atom interactions Energy-dispersive spectroscopy Wavelength-dispersive spectroscopy / electron microprobe Electron energy loss spectroscopy
October 26	Surface and thin film analysis Profilometry Scanning probe microscopies Scanning tunneling microscopy Atomic force microscopy X-ray photoelectron spectroscopy Auger electron spectroscopy Secondary ion mass spectroscopy Rutherford backscattering spectrometry
November 28	Infrared spectroscopy Molecular vibrations Nature of spectrum The Fourier transform and Interferograms The interferometer Instrument Specimen preparation Examples
December 7	Course summary and wrap-up