This course first considers the scattering of x-rays from arbitrary groups of scatterers in order to calculate the scattered intensity for materials in the highly ordered state and those in various conditions of disorder. Fourier series will be used to representthe wave motion and Fourier transforms and convolution functions to obtain the scattered intensity.

The second part of the course will consider types of diffraction and scattering instrumentation, including sources, beam conditioning, instrument geometry, and detectors.

Finally, as time permits, several specific applications will be discussed.